AP54RHC420 Latch
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Apogee Semiconductor AP54RHC420 SemiconductorsDescription
The AP54RHC420 latch is a radiation-hardened dual quad-SR latch with cold sparing and Schmitt trigger inputs, designed for high resiliency to Single-Event Effects (SEE) and Total Ionizing Dose (TID). It features 5ns transient detection at VCC > 3V, single-supply level translation, and supports cold-sparing inputs and outputs. This latch is ideal for applications requiring radiation tolerance and high reliability, such as system-level glitch latching and power supply transient detection.
Introduction
The AP54RHC420 Latch from Apogee Semiconductor is a specialized electronic component designed for environments where reliability and resilience to radiation are paramount. As a dual quad-SR latch with advanced features, it stands out for its robustness in challenging conditions.
Part Description
The AP54RHC420 is a radiation-hardened latch, meaning it is engineered to withstand high levels of radiation without performance degradation. It incorporates cold sparing, allowing it to remain inactive without drawing power until needed, and Schmitt trigger inputs for noise immunity. With the ability to detect transients as short as 5ns at VCC > 3V, it is highly responsive to rapid changes. Its single-supply level translation and support for cold-sparing inputs and outputs make it versatile for a range of system architectures. This latch is particularly suited for applications that demand high reliability and resistance to Single-Event Effects (SEE) and Total Ionizing Dose (TID).
Applications
- System-level glitch latching
- Power supply transient detection
- Radiation-tolerant signal processing
- Data retention in high-radiation environments
- Level translation in mixed-voltage systems
Industries
- Aerospace
- Satellite and space exploration
- Defense and military systems
- Nuclear power and research facilities
- High-reliability industrial automation
Usage Ideas
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Satellite Power Monitoring System
Use the AP54RHC420 to detect and latch transient power events in satellite power distribution units, ensuring system stability during radiation-induced glitches. -
Radiation-Hardened Data Logger
Integrate the latch into a data logging system for nuclear facilities, where it can capture and hold critical event signals despite high radiation exposure. -
Spacecraft Fault Detection Module
Employ the latch in a spacecraft's fault detection and isolation subsystem to reliably capture and retain fault signals caused by single-event upsets.
Conclusion
The AP54RHC420 Latch by Apogee Semiconductor is a robust, radiation-hardened component tailored for high-reliability applications in harsh environments. Its advanced features, such as cold sparing and fast transient detection, make it an excellent choice for aerospace, defense, and other industries where system integrity is non-negotiable. Whether for glitch latching or transient detection, this latch delivers dependable performance where it matters most.