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Filtering by tag: "signal switching"

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Toshiba Photorelays Push Switching Reliability to 135°C

Toshiba introduces compact S-VSON4T photorelays rated for 135°C operation with integrated input resistors, designed for automated test equipment, probe cards, and burn-in systems.

Toshiba, photorelay, TLP3407SRB, TLP3412SRB, TLP3412SRHB, TLP3412SRLB, optoelectronic relay, solid state relay, automated test equipment, semiconductor tester, probe card switching, burn in systems, signal switching, high temperature electronics, S-VSON4T package

ODU Expands ODU-MAC Black-Line With Compact Mass Interconnect

Compact Class platform brings 1,536 signal points and modular receiver options to space constrained test systems.

odu, odu-mac, black-line, compact class, mass interconnect, test systems, ate, signal switching, connectors, high density, modular interconnect

Toshiba Photorelays Push Switching Reliability to 135°C

ODU Expands ODU-MAC Black-Line With Compact Mass Interconnect

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